2005 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Event name
2005 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
 
Event type
Event for scientific audience
 
Start date
01-09-2005
End date
03-09-2005
 
Location
Tokyo
Country
Japan
 
Event format Veranstaltungsformat
On Site

Publications Publikationen



Filter:
Author:  Ungersboeck, E.

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ungersboeck, E. ; Kosina, H. The Effect of Degeneracy on Electron Transport in Strained Silicon Inversion LayersKonferenzbeitrag Inproceedings2005
2Dhar, S. ; Karlowatz, G. ; Ungersboeck, E. ; Kosina, H. Numerical and Analytical Modeling of the High-Field Electron Mobility in Strained SiliconKonferenzbeitrag Inproceedings2005