IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Event name
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
 
Event type
Event for scientific audience
 
Start date
27-06-2005
End date
01-07-2005
 
Location
Singapore
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Gös, Wolfgang
Author:  Horiguchi, N.

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PreviewAuthor(s)TitleTypeIssue Date
1Bury, E. ; Degraeve, R. ; Cho, M. ; Kaczer, Ben ; Gös, Wolfgang ; Grasser, Tibor ; Horiguchi, N. ; Groeseneken, G. Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG DevicesKonferenzbeitrag Inproceedings2014