IS&T/SPIE´s Electronic Imaging 2006
Event name
IS&T/SPIE´s Electronic Imaging 2006
Start date
15-01-2006
End date
19-01-2006
Location
San Jose, California, USA
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Fürtler, Johannes ; Brodersen, Jörg ; Mayer, Konrad J. ; Rössler, Peter ; Cadek, Gerhard ; Eckel, Christian ; Nachtnebel, Herbert | Architecture for Hardware Driven Image Inspection based on FPGAs | Konferenzbeitrag Inproceedings | 2006 |