International Symposium for Testing and Failure Analysis
Event name
International Symposium for Testing and Failure Analysis
Start date
02-11-2008
End date
06-11-2008
Location
Portland, USA
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Heer, Michael ; Pogany, Dionyz ; Street, M. ; Smith, I. ; Riedlberger, F. ; Bonfert, D. ; Gieser, H. | Transient latch-up analysis of power control device with combined light emission and backside transient interferometric mapping methods | Konferenzbeitrag Inproceedings | 2008 |