International Conference on Microelectronic Test Structures (ICMTS 2010)
Event name
International Conference on Microelectronic Test Structures (ICMTS 2010)
Start date
22-03-2010
End date
25-03-2010
Location
Hiroshima
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Pfost, M ; Costachescu, D ; Podgaynaya, Alevtina ; Stecher, Matthias ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich | Small embedded sensors for accurate temperature measurements in DMOS power transistors | Konferenzbeitrag Inproceedings | 2010 |