International Reliability Physics Symposium
Event name
International Reliability Physics Symposium
Start date
02-05-2010
End date
06-05-2010
Location
Anaheim, California
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Shojaei, M ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V | On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD conditions | Konferenzbeitrag Inproceedings | 2010 |