2011 IEEE Conference on Microelectronic Test Structures
Event name
2011 IEEE Conference on Microelectronic Test Structures
Start date
22-03-2010
End date
25-03-2010
Location
Niederlande
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Köck, Helmut ; Illing, Robert ; Ostermann, Thomas ; Decker, Stefan ; Dibra, Donald ; Pobegen, G. ; de Filippis, Stefano ; Glavanovics, Michael ; Pogany, Dionyz | Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology | Konferenzbeitrag Inproceedings | 2010 |