Modeling Aspects in Optical Metrology III
Event name
Modeling Aspects in Optical Metrology III
Start date
23-05-2011
Location
Munich, Germany
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Böhm, J. A. ; Vernes, András ; Vellekoop, Michael J. | Ab initio intensity distribution of diffusely scattered light from rough metallic surfaces | Konferenzbeitrag Inproceedings | 2011 | |
| 2 | Böhm, J. A. ; Vernes, András ; Vorlaufer, G. ; Vellekoop, Michael J. | Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces | Konferenzbeitrag Inproceedings | 2011 |