IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC)

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Description

Event name
IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC)
 
Event type
Event for scientific audience
 
Start date
13-05-2012
End date
16-05-2012
 
Location
Graz, Austria
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Treffer 1-8 von 8 (Suchzeit: 0.002 Sekunden).

VorschauAutor_in(nen)TitelDokumenttypErscheinungs­datum
1Lewis, Soren ; Russold, Michael Friedrich ; Dietl, Hans ; Ruff, Roman ; Dörge, Thomas ; Hoffmann, Klaus-Peter ; Abu-Saleh, Lait ; Schroder, Dietmar ; Krautschneider, Wolfgang ; Westendorff, Stephanie ; Gail, Alexander ; Meiners, Thomas ; Kaniusas, Eugenijus Acquisition of muscle activity with a fully implantable multi-channel measurement systemKonferenzbeitrag Inproceedings 2012
2Walter, Christian ; Schweinzer, Herbert An accurate compact ultrasonic 3D sensor using broadband impulses requiring no initial calibrationKonferenzbeitrag Inproceedings2012
3Syafrudin, Mohammad ; Schweinzer, Herbert ; Walter, Christian An Automated Calibration Method for the Local Positioning System LOSNUSKonferenzbeitrag Inproceedings2012
4Yoo, Han Woong ; Verhaegen, Michel ; von Royen, Martin E. ; Schitter, Georg Automated Adjustment of Aberration Correction in Scanning Confocal MicroscopyKonferenzbeitrag Inproceedings 2012
5Schweighofer, B. ; Wegleiter, H. ; Recheis, Manes ; Fulmek, Paul L. Fast and Accurate Battery Model applicable for EV and HEV SimulationKonferenzbeitrag Inproceedings2012
6Recheis, Manes ; Wegleiter, H. ; Schweighofer, B. ; Fulmek, Paul L. Impedance measurements of ferrite core displacement sensors for flywheel energystorage systemsKonferenzbeitrag Inproceedings 2012
7Paris, René ; Thier, Markus ; Thurner, Thomas ; Schitter, Georg 'Shack-Hartmann Wavefront Sensor based on an Industrial Smart CameraKonferenzbeitrag Inproceedings 2012
8Kuiper, Stefan ; Van den Hof, Paul M. J. ; Schitter, Georg Trade-off between the control bandwidth and the measurement accuracy in Atomic Force MicroscopyKonferenzbeitrag Inproceedings 2012