The 18th IEEE International Conferene on Nanotechnology (ieee nano 2018)
Event name
The 18th IEEE International Conferene on Nanotechnology (ieee nano 2018)
Start date
23-07-2018
End date
26-07-2018
Location
Cork, Irland
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Schneider, Michael ; Schmid, Ulrich | Substrate Temperature and Bias Voltage Dependent Properties of Sputtered AlN Thin Films for BAW Applications | Konferenzbeitrag Inproceedings | 2018 |