Edge 2009
Event name
Edge 2009
Event type
Event for scientific audience
Start date
17-05-2009
End date
22-05-2009
Location
Banff; Alberta, Canada
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Stöger-Pollach, Michael ; Shirley, Eric L. ; Schattschneider, Peter | Investigating the dielectric properties of silicon by means of valence EELS in a TEM | Präsentation Presentation | 2009 |