Microscopy of Semiconducting Materials (MSM-XIX)
Event name
Microscopy of Semiconducting Materials (MSM-XIX)
Event type
Event for scientific audience
Start date
29-03-2015
End date
02-04-2015
Location
Cambridge
Country
Event format Veranstaltungsformat
On Site
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Müller, Knut ; Krause, Florian ; Béché, Armand ; Schowalter, Marco ; Galioit, Vincent ; Löffler, Stefan ; Verbeeck, Johan ; Zweck, Josef ; Schattschneider, Peter ; Rosenauer, Andreas | Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields | Präsentation Presentation | 2015 |