PICO 2015 - 3rd Conference on Frontiers of Aberration Corrected Electron Microscopy
Event name
PICO 2015 - 3rd Conference on Frontiers of Aberration Corrected Electron Microscopy
Event type
Event for scientific audience
Start date
19-04-2015
End date
23-04-2015
Location
Kasteel Vaalsbroek, The Netherlands
Country
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Schattschneider, Peter | News about EMCD - Dichroism in the (S)TEM | Präsentation Presentation | 2015 |