20th Microscopy of Semi Conducting Materials (MSM XX)

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Description

Event name
20th Microscopy of Semi Conducting Materials (MSM XX)
 
Event type
Event for scientific audience
 
Start date
09-04-2017
End date
13-04-2017
 
Location
Oxford
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pofelski, Alexandre ; Woo, Steffi Y ; Le, B.H. ; Zhao, S. ; Mi, Z. ; Löffler, Stefan ; Botton, Gianluigi A. 2D Strain mapping on AlGaN/GaN nanowire arrays using STEM Moiré interferometryPräsentation Presentation2017