12th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis (ESREF)
Event name
12th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis (ESREF)
Event type
Event for scientific audience
Start date
01-10-2001
End date
05-10-2001
Location
Bordeaux, France
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Leicht, M. ; Fritzer, G. ; Basnar, B. ; Golka, Sebastian ; Smoliner, Jürgen | A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices | Präsentation Presentation | 2001 |