International Conference on Defects in Semiconductors
Event name
International Conference on Defects in Semiconductors
Event type
Event for scientific audience
Start date
24-07-2005
End date
29-07-2005
Location
Awaji Island, Hyogo, Japan
Country
Austria
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Moutanabbir, O ; Terreault, B ; Chicoinec, M ; Simpson, J ; Zahel, Thomas ; Hobler, Gerhard | Hydrogen/Deuterium-defect complexes involved in the ion-cutting of Si(001) at the sub-100 nm scale | Präsentation Presentation | 2005 |