Semiconductor Interface Specialists Conference (SISC)
Event name
Semiconductor Interface Specialists Conference (SISC)
Event type
Event for scientific audience
Start date
06-12-2007
End date
08-12-2007
Location
Arlington
Country
Event format Veranstaltungsformat
On Site
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Martens, K. ; Kaczer, Ben ; Grasser, Tibor ; De Jaeger, B. ; Meuris, M. ; Groeseneken, G. ; Maes, H.E. | Charge Pumping Charcaterization of Germanium MOSFETs | Präsentation Presentation | 2007 | |
| 2 | Toledano-Luque, M. ; Kaczer, Ben ; Roussel, Ph. J. ; Degraeve, R. ; Franco, J. ; Kauerauf, T. ; Grasser, Tibor ; Groeseneken, G. | Depth Localization of Trapped Holes in SiON after Positive and Negative Gate Stress | Präsentation Presentation | 2010 | |
| 3 | Franco, J. ; Kaczer, Ben ; Mitard, J. ; Eneman, G. ; Roussel, Ph. J. ; Crupi, F. ; Grasser, Tibor ; Witters, L. ; Hoffmann, T.Y. ; Groeseneken, G. | Implications of Channel Hot Carrier Degradation in Si0.45Ge0.55 pMOSFETs | Präsentation Presentation | 2010 |