40#^{th} Semiconductor Interface Specialists Conference (SISC)
Event name
40#^{th} Semiconductor Interface Specialists Conference (SISC)
Event type
Event for scientific audience
Start date
03-12-2009
End date
05-12-2009
Location
Washington
Country
Event format Veranstaltungsformat
On Site
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Franco, J. ; Kaczer, Ben ; Stesmans, A. ; Afanas´Ev, V. ; Martens, K. ; Aoulaiche, M. ; Grasser, Tibor ; Mitard, J. ; Groeseneken, G. | Impact of Si-Passivation Thickness and Processing on NBTI Reliability of Ge and SiGe pMOSFETs | Präsentation Presentation | 2009 |