European Failure Analysis Network
Event name
European Failure Analysis Network
Event type
Event for scientific audience
Start date
28-11-2011
End date
29-11-2011
Location
Toulouse, France
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Rhayem, J ; Van der Voorde, L ; Wieers, A ; Heer, Michael ; Pogany, Dionyz | Wear out analysis in vertical DMOS under repetitive short circuit testing | Präsentation Presentation | 2011 |