Industrial Technologies 2016
Event name
Industrial Technologies 2016
Event type
Event for scientific audience
Start date
22-06-2016
End date
24-06-2016
Location
Amsterdam (the Netherlands)
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Lieb, Andreas ; Howald, Lukas ; Fricker, Simon ; Thier, Markus ; Schitter, Georg | Atomic Force Microscope for In-Line Metrology | Präsentation Presentation | 2016 | |
| 2 | Thier, Markus ; Saathof, Rudolf ; Hainisch, Reinhard ; Schitter, Georg | Metrology Platform to Enable In-Line Nanometrology | Präsentation Presentation | 2016 |