Industrial Technologies 2016

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Description

Event name
Industrial Technologies 2016
 
Event type
Event for scientific audience
 
Start date
22-06-2016
End date
24-06-2016
 
Location
Amsterdam (the Netherlands)
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Lieb, Andreas ; Howald, Lukas ; Fricker, Simon ; Thier, Markus ; Schitter, Georg Atomic Force Microscope for In-Line MetrologyPräsentation Presentation2016
2Thier, Markus ; Saathof, Rudolf ; Hainisch, Reinhard ; Schitter, Georg Metrology Platform to Enable In-Line NanometrologyPräsentation Presentation2016