ESF Workshop: Growth, structure and electrical properties of high-k gate dielectrics: atomistic modeling vs experiment
Event name
ESF Workshop: Growth, structure and electrical properties of high-k gate dielectrics: atomistic modeling vs experiment
Event type
Event for scientific audience
Start date
17-03-2003
End date
18-03-2003
Location
Zürich, Switzerland
Country
Austria
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Först, Clemens J. | Interfacing High-K Oxides with Silicon: Solutions from Ab-Initio Simulations | Präsentation Presentation | 2003 |