Microscopy of Semiconducting Materials 2001
Event name
Microscopy of Semiconducting Materials 2001
Event type
Event for scientific audience
Start date
25-03-2002
End date
29-03-2002
Location
Oxford, UK
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Stöger-Pollach, Michael ; Breymesser, A. ; Schattschneider, Peter | Investigation of impurity enrichment and electronic properties of microcrystalline silicon thin films | Präsentation Presentation | 2002 |