9th Int. Symp. on Advanced Physical Fields: Characterization of Artificial Nanostructures and Nanomaterials Symposium on Advanced Physical Fields: Characterization of Artificial Nanostructures and Nanomaterials
Event name
9th Int. Symp. on Advanced Physical Fields: Characterization of Artificial Nanostructures and Nanomaterials
Symposium on Advanced Physical Fields: Characterization of Artificial Nanostructures and Nanomaterials
Event type
Event for scientific audience
Start date
03-03-2004
Location
Nat. Inst. of Materials Science, Tsukuba/Japan
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Powell, C.J. ; Jablonski, A. ; Werner, Wolfgang S.M. ; Smekal, Werner | Characterization of Thin Films on the Nanometer Scale by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy | Präsentation Presentation | 2004 |