The 23rd International Conference on Defects in Semiconductors
Event name
The 23rd International Conference on Defects in Semiconductors
Event type
Event for scientific audience
Start date
24-07-2005
End date
29-07-2005
Location
Awaji Island/ Japan
Country
Event format Veranstaltungsformat
On Site
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Petter, K. ; Eyidi, Dominique ; Stöger-Pollach, Michael ; Sieber, I. ; Schubert-Bischoff, P. ; Rau, B. ; Tham, A.T. ; Schattschneider, Peter ; Gall, S. ; Lips, K. ; Fuhs, W. | Line defects in epitaxial silicon films grown at 560°C | Präsentation Presentation | 2005 |