ICDS -24, 24th International Conference on Defects in Semiconductors
Event name
ICDS -24, 24th International Conference on Defects in Semiconductors
Event type
Event for scientific audience
Start date
22-07-2007
End date
27-07-2007
Location
New Mexico, USA
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Pongratz, Peter ; Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. | Analysis of Experimental TEM Image Contrast of Amorphous Pockets using Molecular Dynamics Computer Simulations aof Collision Cascades in Silicon | Präsentation Presentation | 2007 |