Event name
TXRF 2011 Conference
 
Event type
Event for scientific audience
 
Start date
07-06-2011
End date
09-06-2011
 
Location
Dortmund, Germany
Country
Europe
 
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Kregsamer, Peter
Author:  Borionetti, G.

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PreviewAuthor(s)TitleTypeIssue Date
1Kregsamer, Peter ; Nutsch, A. ; Borionetti, G. ; Beckhoff, B. ; Müller, M. ; Polignano, M.L. ; Pepponi, Giancarlo ; Fittschen, U. ; Streli, Christina Round robin test for TXRF and ToF-SIMS on various types of Ni samples on Si wafer surfaces within the network ANNAPräsentation Presentation2011