2022 IEEE 40th VLSI Test Symposium (VTS)

Event name
2022 IEEE 40th VLSI Test Symposium (VTS)
 
Event type
Event for scientific audience
 
Start date
25-04-2022
End date
27-04-2022
 
Country
United States
 
Event format Veranstaltungsformat
Online

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Dave, Shail ; Marchisio, Alberto ; Hanif, Muhammad Abdullah ; Guesmi, Amira ; Shrivastava, Aviral ; Alouani, Ihsen ; Shafique, Muhammad Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML SystemsInproceedings Konferenzbeitrag 2022