34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023)

Event name
34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023)
 
Event type
Event for scientific audience
 
Start date
02-10-2023
End date
05-10-2023
 
Location
Toulouse
Country
France
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Stabentheiner, Manuel ; Diehle, Patrick ; Altmann, F. ; Hübner, S. ; Lejoyeux, M. ; Taylor, A.A. ; Wieland, D. ; Pogany, Dionyz ; Ostermaier, Clemens Test concept for a direct correlation between dislocations and the intrinsic degradation of lateral PIN diodes in GaN-on-Si under reverse biasPresentation Vortrag4-Oct-2023