Title Titel
Acta Materialia
 
e-ISSN
1873-2453
 
ISSN
1359-6454
 
Publisher Herausgeber
PERGAMON-ELSEVIER SCIENCE LTD
 
Publisher's Address Herausgeber Adresse
THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Chen, Zhuo

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Chen-2022-Acta Materialia-vor.pdf.jpgChen, Zhuo ; Zheng, Yonghui ; Huang, Yong ; Gao, Zecui ; Sheng, Huaping ; Bartosik, Matthias ; Mayrhofer, Paul H. ; Zhang, Zaoli Atomic-scale understanding of the structural evolution in TiN/AlN superlattice during nanoindentation—Part 2: StrengtheningArticle Artikel 1-Aug-2022
2Chen-2022-Acta Materialia-vor.pdf.jpgChen, Zhuo ; Zheng, Yonghui ; Huang, Yong ; Gao, Zecui ; Sheng, Huaping ; Bartosik, Matthias ; Mayrhofer, Paul H. ; Zhang, Zaoli Atomic-scale understanding of the structural evolution of TiN/AlN superlattice during nanoindentation— Part 1: DeformationArticle Artikel 1-Aug-2022
3Koutna-2022-Acta Materialia-vor.pdf.jpgKoutná, Nikola ; Löfler, Lukas ; Holec, David ; Chen, Zhuo ; Zhang, Zaoli ; Hultman, Lars ; Mayrhofer, Paul H. ; Sangiovanni, Davide G. Atomistic mechanisms underlying plasticity and crack growth in ceramics: a case study of AlN/TiN superlatticesArticle Artikel 1-May-2022
4Chen, Zhuo ; Holec, David ; Bartosik, Matthias ; Mayrhofer, Paul H. ; Zhang, Zaoli Crystallographic orientation dependent maximum layer thickness of cubic AlN in CrN/AlN multilayersArtikel Article 2019
5Chen, Zhuo ; Shao, Qinqin ; Bartosik, Matthias ; Mayrhofer, Paul H. ; Chen, Hong ; Zhang, Zaoli Growth-twins in CrN/AlN multilayers induced by hetero-phase interfacesArtikel Article 2020
6Zhang, Zaoli ; Chen, Zhuo ; Holec, David ; Liebscher, Christian H. ; Koutná, Nikola ; Bartosik, Matthias ; Zheng, Yonghui ; Dehm, Gerhard ; Mayrhofer, Paul H. Mapping the mechanical properties in nitride coatings at the nanometer scaleArtikel Article 2020
7Buchinger, Julian ; Koutná, Nikola ; Chen, Zhuo ; Zhang, Zaoli ; Mayrhofer, Paul Heinz ; Holec, David ; Bartosik, Matthias Toughness enhancement in TiN/WN superlattice thin filmsArtikel Article 2019