Title Titel
Applied Surface Science
 
e-ISSN
1873-5584
 
ISSN
0169-4332
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Surfaces and Interfaces
Author:  Stöger-Pollach, Michael

Results 1-3 of 3 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Götsch, Thomas ; Schachinger, Thomas ; Stöger-Pollach, Michael ; Kaindl, Reinhard ; Penner, Simon Carbon tolerance of Ni-Cu and Ni-Cu/YSZ sub- m sized SOFC thinfilm model systemsArtikel Article 2017
2Gillinger, M. ; Shaposhnikov, K. ; Knobloch, T. ; Stöger-Pollach, M. ; Artner, W. ; Hradil, K. ; Schneider, M. ; Kaltenbacher, M. ; Schmid, U. Enhanced c-axis orientation of aluminum nitride thin films by plasma-based pre-conditioning of sapphire substrates for SAW applicationsArtikel Article 2018
3Götsch, Thomas ; Mayr, Lukas ; Stöger-Pollach, Michael ; Klötzer, Bernhard ; Penner, Simon Preparation and characterization of epitaxially grown unsupported yttria-stabilized zirconia (YSZ) thin filmsArtikel Article 2015