IEEE Transactions on Nuclear Science

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Journal description

Title Titel
IEEE Transactions on Nuclear Science
 
e-ISSN
1558-1578
 
ISSN
0018-9499
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Zimmermann, Horst

Results 1-5 of 5 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Mitrovic, Mladen ; Hofbauer, Michael ; Schneider-Hornstein, Kerstin ; Goll, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Evidence of Pulse Quenching in AND and OR Gates by experimental Probing of Full Single-Event Transient WaveformsArtikel Article 2018
2Mitrovic, Mladen ; Hofbauer, Michael ; Goll, Bernhard ; Schneider-Hornstein, Kerstin ; Swoboda, Robert ; Steindl, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65-nm CMOSArtikel Article 2017
3Mitrovic, Mladen ; Hofbauer, Michael ; Voss, Kay-Obbe ; Zimmermann, Horst Experimental Investigation of the Joint lnfluence of Reduced Supply Voltage and Charge Sharing on Single-Event Transient Waveforms in 65-nm Triple-Well CMOSArtikel Article 2018
4Hofbauer, M. ; Schweiger, K. ; Dietrich, H. ; Zimmermann, H. ; Voss, K-O ; Merk, B. ; Schmid, U. ; Steininger, A. Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter ChainArtikel Article2012
5Hofbauer, Michael ; Schweiger, Kurt ; Zimmermann, Horst ; Giesen, Ulrich ; Langner, Frank ; Schmid, Ulrich ; Steininger, Andreas Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha IrradiationArtikel Article2013