Journal of Microscopy

Title Titel

e-ISSN

1365-2818

ISSN

0022-2720

Publisher Herausgeber

WILEY

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Author: Bukvišova, Krýstina

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		Preview	Author(s)	Title	Type	Issue Date
	1		Stöger-Pollach, Michael ; Bukvišova, Krýstina ; Zenz, Keanu ; Stöger, Leo ; Scales, Ze	Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscope	Article Artikel	13-Nov-2023