Microelectronics Reliability

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Journal description

Title Titel
Microelectronics Reliability
 
e-ISSN
1872-941X
 
ISSN
0026-2714
 
Publisher Herausgeber
PERGAMON-ELSEVIER SCIENCE LTD
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 
 

Publications Publikationen

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Subject:  Surfaces, Coatings and Films
Date Issued:  [2000 TO 2009]
Date Issued:  2008

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Heer, M. ; Grombach, P. ; Heid, A. ; Pogany, D. Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applicationsArtikel Article2008
2Aichinger, T. ; Nelhiebel, M. ; Grasser, T. On the Temperature Dependence of NBTI RecoveryArtikel Article2008