Surface and Interface Analysis

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Journal description

Title Titel
Surface and Interface Analysis
 
e-ISSN
1096-9918
 
ISSN
0142-2421
 
Publisher Herausgeber
WILEY
 
Publisher's Address Herausgeber Adresse
111 RIVER ST, HOBOKEN, USA, NJ, 07030-5774
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Materials Chemistry
Author:  Werner, W. S. M.

Results 1-5 of 5 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Powell, C. J. ; Werner, W. S. M. ; Smekal, W. ; Tasneem, G. Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on siliconArtikel Article2013
2Powell, C. J. ; Werner, W. S. M. ; Smekal, W. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2011
3Werner, Wolfgang S.M. ; Helmberger, Fabian ; Schürrer, Manuel ; Eisenmenger-Sittner, Christoph ; Ridzel, Olga Y. Measurement of the surface excitation parameter of Kapton, polyethylene (PE), polymethyl methacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE)Artikel Article Jul-2022
4Yuryevna Ridzel, Olga ; Kalbe, Henryk ; Astašauskas, Vytautas ; Kuksa, Pavel ; Bellissimo, Alessandra ; Werner, Wolfgang S. M. Optical constants of organic insulators in the UV range extracted from reflection electron energy loss spectraArtikel Article 2022
5Bianchi, D. ; Katona, L. ; Brenner, J. ; Vorlaufer, G. ; Vernes, A. ; Werner, W. S. M. ; Betz, G. Surface roughness, waviness, and shape induced effects in angle-resolved XPSArtikel Article 2011