Surface and Interface Analysis

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Journal description

Title Titel
Surface and Interface Analysis
 
e-ISSN
1096-9918
 
ISSN
0142-2421
 
Publisher Herausgeber
WILEY
 
Publisher's Address Herausgeber Adresse
111 RIVER ST, HOBOKEN, USA, NJ, 07030-5774
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Smekal, W.

Results 1-6 of 6 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Powell, C. J. ; Werner, W. S. M. ; Smekal, W. ; Tasneem, G. Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on siliconArtikel Article2013
2Powell, C. J. ; Werner, W. S. M. ; Smekal, W. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2011
3Tasneem, Ghazala ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2014
4Tasneem, Ghazala ; Tomastik, Christian ; Gerhold, Stefan ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulationsArtikel Article2010
5Smekal, Werner ; Werner, Wolfgang S.M. ; Powell, C.J. Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectronspectroscopyArtikel Article2005
6Tasneem, Ghazala ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Simulation of parallel angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2010