Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29a, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Results 1-8 of 8 (Search time: 0.001 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Řiháček, T. ; Horák, M. ; Schachinger, T. ; Mika, F. ; Matějka, M. ; Krátký, S. ; Fořt, T. ; Radlička, T. ; Johnson, C.W. ; Novák, L. ; Sed’a, B. ; McMorran, B.J. ; Müllerová, I. Beam shaping and probe characterization in the scanning electron microscopeArtikel Article2021
2Stöger-Pollach, Michael ; Pichler, Cornelia F. ; Dan, Topa ; Zickler, Gregor A. ; Bukvišová, Kristýna ; Eibl, Oliver ; Brandstätter, Franz Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscopeArtikel Article2021
3Scheucher, Michael ; Schachinger, Thomas ; Spielauer, Thomas ; Stöger-Pollach, Michael ; Haslinger, Philipp Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlationsArticle Artikel 18-Aug-2022
4Schachinger, Thomas ; Hartel, P. ; Lu, P. ; Löffler, Stefan ; Obermair, Martin ; Dries, M ; Gerthens, D ; Dunin-Borkowski, Rafal ; Schattschneider, Peter Experimental realization of a 𝜋/2 vortex mode converter for electrons using a spherical aberration correctorArtikel Article2021
5Ederer-2022-Ultramicroscopy-vor.pdf.jpgEderer, Manuel ; Löffler, Stefan Image difference metrics for high-resolution electron microscopyArticle Artikel Oct-2022
6Lammer-2022-Ultramicroscopy-vor.pdf.jpgLammer, Judith ; Berger, Christian ; Löffler, Stefan ; Knez, Daniel ; Longo, Paolo ; Kothleitner, Gerald ; Hofer, Ferdinand ; Haberfehlner, Georg ; Bucher, Edith ; Sitte, Werner ; Grogger, Werner A method for a column-by-column EELS quantification of barium lanthanum ferrateArticle Artikel 26-Jan-2022
7Loeffler-2022-Ultramicroscopy-vor.pdf.jpgLöffler, Stefan Unitary two-state quantum operators realized by quadrupole fields in the electron microscopeArticle Artikel Apr-2022
8Stöger-Pollach, Michael ; Stöger-Pollach, Michael ; Löffler, Stefan ; Maurer, Niklas ; Bukvisová, Kristýna Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceArtikel Article2020