Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Results 1-20 of 67 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pofelski, A. ; Woo, S.Y. ; Le, B.H. ; Liu, X. ; Zhao, S. ; Mi, Z. ; Löffler, S. ; Botton, G.A. 2D strain mapping using scanning transmission electron microscopy Moiréinterferometry and geometrical phase analysisArtikel Article 2018
2Löffler, S. ; Motsch, V. ; Schattschneider, P. A pure state decomposition approach of the mixed dynamic form factor for mapping atomic orbitalsArtikel Article2013
3Stöger-Pollach, Michael A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMArtikel Article2014
4Löffler, S. ; Schattschneider, P. A software package for the simulation of energy-loss magnetic chiral dichroismArtikel Article2010
5Ito, Shingo ; Schitter, Georg Atomic Force Microscopy Capable of Vibration Isolation with Low-stiffness Z-axis ActuationArtikel Article 2018
6Řiháček, T. ; Horák, M. ; Schachinger, T. ; Mika, F. ; Matějka, M. ; Krátký, S. ; Fořt, T. ; Radlička, T. ; Johnson, C.W. ; Novák, L. ; Sed’a, B. ; McMorran, B.J. ; Müllerová, I. Beam shaping and probe characterization in the scanning electron microscopeArtikel Article 2021
7Schütz, G. ; Rembold, A. ; Pooch, A. ; Meier, S. ; Schneeweiss, P. ; Rauschenbeutel, A. ; Günther, A. ; Chang, W.T. ; Hwang, I.S. ; Stibor, A. Biprism Electron Interferometry with a Single Atom Tip SourceArtikel Article2014
8Löffler, S. ; Ennen, I. ; Tian, F. ; Schattschneider, P. ; Jaouen, N. Breakdown of the dipole approximation in core lossesArtikel Article 2011
9Suchorski, Y. ; Hupalo, M.S. Coadsorption of lithium and oxygen on W(112): Nanosized facets versus single crystalsArtikel Article2011
10Stöger-Pollach, Michael ; Pichler, Cornelia F. ; Dan, Topa ; Zickler, Gregor A. ; Bukvišová, Kristýna ; Eibl, Oliver ; Brandstätter, Franz Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscopeArtikel Article 2021
11Fantner, G. E. ; Schitter, Georg ; Kindt, J. H. ; Ivanov, Tzvetan ; Ivanova, Katerina ; Patel, Rohan ; Holten-Andersen, Niels ; Adams, Jonathan ; Thurner, Philipp J. ; Rangelow, I.W. ; Hansma, Paul K. Components for high-speed atomic force microscopyArtikel Article2006
12Wallisch, Wolfgang ; Stöger-Pollach, Michael ; Navickas, Edvinas Consequences of the CMR effect on EELS in TEMArtikel Article 2017
13Stoeger-Pollach-2023-Ultramicroscopy-vor.pdf.jpgStöger-Pollach, Michael ; Zenz, Keanu ; Ursin, Felix ; Schilberg, Johannes ; Stöger, Leo A correction for higher-order refraction in cathodoluminescence spectrometryArticle Artikel 2023
14Scheucher, Michael ; Schachinger, Thomas ; Spielauer, Thomas ; Stöger-Pollach, Michael ; Haslinger, Philipp Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlationsArticle Artikel 18-Aug-2022
15Gatel, C. ; Warot-Fonrose, B. ; Schattschneider, P. Distortion corrections of ESI data cubes for magnetic studiesArtikel Article2009
16Warot-Fonrose, B. ; Gatel, C. ; Calmels, L. ; Serin, V. ; Schattschneider, P. Effect of spatial and energy distortions on energy-loss magnetic chiral dichroism measurements: Application to an iron thin filmArtikel Article2010
17Hébert, Cécile ; Schattschneider, Peter ; Franco, H. ; Jouffrey, B. ELNES at magic angle conditionsArtikel Article2006
18Schachinger, T. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Stöger-Pollach, M. ; Schneider, S. ; Pohl, D. ; Rellinghaus, B. ; Schattschneider, P. EMCD with an electron vortex filter: Limitations and possibilitiesArtikel Article 2017
19Schattschneider, P. ; Löffler, S. Entanglement and decoherence in electron microscopyArtikel Article 2018
20Schattschneider, P. Exchange of angular momentum in EMCD experimentsArtikel Article2008