Ultramicroscopy

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Journal description

Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2009]
Date Issued:  2008

Results 1-8 of 8 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schattschneider, P. Exchange of angular momentum in EMCD experimentsArtikel Article2008
2Schattschneider, Peter ; Verbeeck, Jo Fringe contrast in inelastic LACBED holographyArtikel Article2008
3Schattschneider, Peter ; Hébert, Cécile ; Rubino, Stefano ; Stöger-Pollach, Michael ; Rusz, Ján ; Novák, Pavel Magnetic circular dichroism in EELS: Towards 10 nm resolutionArtikel Article2008
4Hébert, C. ; Schattschneider, P. ; Rubino, S. ; Novak, P. ; Rusz, J. ; Stöger-Pollach, M. Magnetic circular dichroism in electron energy loss spectrometryArtikel Article2008
5Verbeeck, J. ; Bertoni, G. Model-based quantification of EELS spectra: Treating the effect of correlated noiseArtikel Article2008
6Verbeeck, J. ; Hébert, C. ; Rubino, S. ; Novák, P. ; Rusz, J. ; Houdellier, F. ; Gatel, C. ; Schattschneider, P. Optimal aperture sizes and positions for EMCD experimentsArtikel Article2008
7Verbeeck, Jo ; Bertoni, Giovanni ; Schattschneider, Peter The Fresnel effect of a defocused biprism on the fringes in inelastic holographyArtikel Article2008
8Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article 2008