Ultramicroscopy

View Statistics Email Alert RSS Feed

Journal description

Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Filter:
Subject:  Atomic and Molecular Physics, and Optics
Author:  Stöger-Pollach, M.
Subject:  EELS

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stöger-Pollach, M. ; Schattschneider, P. The influence of relativistic energy losses on bandgap determination using valence EELSArtikel Article Nov-2007
2Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article2008