Ultramicroscopy

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Journal description

Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Atomic and Molecular Physics, and Optics
Subject:  EELS

Results 1-6 of 6 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Löffler, S. ; Ennen, I. ; Tian, F. ; Schattschneider, P. ; Jaouen, N. Breakdown of the dipole approximation in core lossesArtikel Article 2011
2Warot-Fonrose, B. ; Gatel, C. ; Calmels, L. ; Serin, V. ; Schattschneider, P. Effect of spatial and energy distortions on energy-loss magnetic chiral dichroism measurements: Application to an iron thin filmArtikel Article2010
3Schattschneider, Peter ; Verbeeck, Jo Fringe contrast in inelastic LACBED holographyArtikel Article2008
4Stöger-Pollach, M. ; Schattschneider, P. The influence of relativistic energy losses on bandgap determination using valence EELSArtikel Article Nov-2007
5Verbeeck, Jo ; Bertoni, Giovanni ; Schattschneider, Peter The Fresnel effect of a defocused biprism on the fringes in inelastic holographyArtikel Article2008
6Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article2008