Characterization of the influence of the sample shape on accuracy, statistics and reproducibility in TXRF Analysis of semiconductor surfaces

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Primary Data

Project Acronym Projekt Kurzbezeichnung
TXRF-SC
 
Project Title (de) Projekttitel (de)
Characterization of the influence of the sample shape on accuracy, statistics and reproducibility in TXRF Analysis of semiconductor surfaces
 
Consortium Coordinator Koordinator des Konsortiums
Principal Investigator Projektleiter_in
 
Status
CLOSED