Charactereisatioon of nanometer-layers by grazing incidence X-ray florescence analysis combined with X-ray reflectometry


Project Acronym Projekt Kurzbezeichnung
Nanometer-Schichten
 
Project Title (de) Projekttitel (de)
Charactereisatioon of nanometer-layers by grazing incidence X-ray florescence analysis combined with X-ray reflectometry
 
Consortium Coordinator Koordinator des Konsortiums
Principal Investigator Projektleiter_in
 
Status
CLOSED