Full name Familienname, Vorname
Werner, Wolfgang
 
Main Affiliation Organisations­zuordnung
 

Results 121-140 of 219 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
121Bogus, A.M. ; Werner, Wolfgang S.M. ; Gebeshuber, I.C. ; Dörr, M. ; Störi, Herbert Tribochemistry of monomolecular lubricant films of ethanolamine oligomersKonferenzbeitrag Inproceedings2008
122Spoljaric-Lukacic, Lidija ; Esfandiari, Parichehr ; Koch, Thomas ; Limbeck, Andreas ; Werner, Wolfgang S.M. ; Knaus, Simone Diketone and Dioxime Functionalized Polypropylene: Surface Photograting and Electroless MetalizationKonferenzbeitrag Inproceedings2008
123Psychogyiopoulou, Krystallia ; Tomala, Agnieszka ; Werner, Wolfgang S.M. ; Gebeshuber, I.C. ; Dörr, Nicole ; Störi, Herbert Tribochemistry of isomer and oligomer lubricant filmsKonferenzbeitrag Inproceedings2008
124Werner, Wolfgang S.M. ; Went, Michael R. ; Vos, Maarten Surface plasmon excitation at a Au surface by 150-40,000 eV electronsArtikel Article 1-Sep-2007
125Maszl, Christian ; Werner, Wolfgang S.M. Überblick der Aktivitäten der Arbeitsgruppe Oberflächen und Plasma TechnologiePräsentation Presentation2007
126Werner, Wolfgang S.M. Electron scattering data extracted from reflection measurements applied to quantitative analysis of XPS and AES spectraPräsentation Presentation2007
127Werner, Wolfgang S.M. Reflection Electron Energy Loss SpectroscopyPräsentation Presentation2007
128Werner, Wolfgang S.M. Simulation of Electron Spectra for Surface Analysis - Status QuoPräsentation Presentation2007
129Werner, Wolfgang S.M. Angle Resolved XPS-Modelling of SpectraPräsentation Presentation2007
130Werner, Wolfgang S.M. Angle Resolved XPS-Workshop SummaryPräsentation Presentation2007
131Werner, Wolfgang S.M. Optical constants of solids measured with Reflection Electron Energy Loss spectroscopy (REELS)Präsentation Presentation2007
132Werner, Wolfgang S.M. Analysis of reflection electron energy loss spectra (REELS) for determination of the dielectric function of solids: Fe, Co, NiArtikel Article2007
133Offi, F. ; Werner, W. S. M. ; Sacchi, M. ; Torelli, P. ; Cautero, M. ; Cautero, G. ; Fondacaro, A. ; Huotari, S. ; Monaco, G. ; Paolicelli, G. ; Smekal, W. ; Stefani, G. ; Panaccione, G. Comparison of hard and soft x-ray photoelectron spectra of siliconArtikel Article2007
134Novak, M.A. ; Egri, S. ; Köver, Laszlo ; Cserny, I. ; Drube, W. ; Werner, Wolfgang S.M. Energy dependence of electron energy loss processes in Ge 2s photoemissionArtikel Article2007
135Esfandiari, Parichehr ; Spoljaric-Lukacic, Lidija ; Koch, Thomas ; Limbeck, Andreas ; Werner, Wolfgang S.M. ; Knaus, Simone Surface Photografting and Metalization of PolypropyleneKonferenzbeitrag Inproceedings2007
136Powell, C.J. ; Werner, Wolfgang S.M. ; Smekal, Werner Distinguishability of N Composition Profiles In SiON Films On Si By Angle-Resolved X-ray Photoelectron SpectroscopyKonferenzbeitrag Inproceedings2007
137Werner, Wolfgang S.M. Photon and electron induced electron emission from solid surfacesBuchbeitrag Book Contribution2007
138Werner, Wolfgang S.M. ; Tomastik, Christian ; Smekal, Werner ; Moon, D.W. ; Kim, K.J. ; Powell, C.J. Film thickness determination of ultra thin HfO₂ dielectrics with angle resolved XPS: Experimental electron scattering dataPräsentation Presentation2006
139Werner, Wolfgang S.M. Surface Sensitivity of Electron Spectroscopy Techniques- Status-Quo and PerspectivesPräsentation Presentation2006
140Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA)Präsentation Presentation2006