Prefix title Titel (vorangestellt)
Ao.Univ.Prof. Dipl.-Ing. Dr.techn.
 
Full name Familienname, Vorname
Hutter, Herbert
 

Results 1-20 of 158 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Navickas, Edvinas ; Nenning, Andreas ; Lu, Qiyang ; Hutter, Herbert ; Yildiz, Bilge ; Fleig, Jürgen Water-Induced Decoupling of Tracer and Electrochemical Oxygen Excahange Kinetics on Mixed Conducting ElectrodesPräsentation Presentation2016
2Fleig, Jürgen ; Schintlmeister, Arno ; Gerstl, Matthias ; Hutter, Herbert Voltage-assisted 180 tracer incorporation as a tool for obtaining shallow diffusion profiles: Basic considerations and application to YSZ single crystals and thin filmsKonferenzbeitrag Inproceedings2009
3Fleig, Jürgen ; Opitz, Alexander ; Kubicek, Markus ; Gerstl, Matthias ; Frömling, Till ; Hutter, Herbert Voltage Driven 18O Tracer Injection as a Tool for Analyzing Electrochemical Reactions on Oxides and Ion Conduction in Thin Oxide FilmsKonferenzbeitrag Inproceedings2011
4Opitz, Alexander ; Kubicek, Markus ; Huber, Stefanie ; Huber, Tobias ; Nenning, Andreas ; Navickas, Edvinas ; Holzlechner, Gerald ; Hutter, Herbert ; Fleig, Jürgen Visualization of electrochemical reduction zones by cathodic18O incorporation at model electrodes: strengths and limitationsKonferenzbeitrag Inproceedings2014
5Krecar, Dragan ; Vassileva, Vassilka ; Danninger, Herbert ; Hutter, Herbert Untersuchung von Sinteraktivatoren in PM Stählen mittels SIMSPräsentation Presentation2004
6Fleig, Jürgen ; Frömling, Till ; Hutter, Herbert Transport Properties of Oxygen Vacancies in Donor Doped Lead Zirconate Titanate (PZT)Präsentation Presentation2010
7Fleig, Jürgen ; Frömling, Till ; Hutter, Herbert Transport Properties of Oxygen Vacancies in Donor Doped Lead Zirconate Titanate (PZT)Konferenzbeitrag Inproceedings2010
8Preis, Wolfgang ; Hou, J ; Sitte, Werner ; Zhang, Z ; Dehm, G. ; Frömling, Till ; Hutter, Herbert ; Fleig, Jürgen Transport properties and structure of interfaces in-type barium titanate ceramicsKonferenzbeitrag Inproceedings2011
9Fleig, Jürgen ; Kubicek, Markus ; Langer-Hansel, Katharina ; Opitz, Alexander ; Kogler, Sandra ; Hutter, Herbert Tracer Monitoring of Active and Resistive Zones for SOFC ApplicationsKonferenzbeitrag Inproceedings2011
10Smetaczek, Stefan ; Wachter-Welzl, Andreas ; Kubicek, Markus ; Ring, Joseph ; Taibl, Stefanie ; Rettenwander, Daniel ; Wagner, Reinhard ; Hutter, Herbert ; Limbeck, Andreas ; Fleig, Jürgen Towards a better Understanding of the Conductivity of Li7La3Zr2O12: Correlating Composition Variations and local ConductivitiesKonferenzbeitrag Inproceedings2018
11Hutter, Herbert TOF-SIMS: a New Tool for NanoanalyticPräsentation Presentation2007
12Puchner, Stefan ; Hutter, Herbert ; Eisenmenger-Sittner, Christoph TOF-SIMS Investigations on thermal treated CuMo-Surfaces on a C-SubstratePräsentation Presentation2007
13Puchner, Stefan ; Hutter, Herbert ; Schnöller, Johannes TOF-SIMS Investigations on Oxide and Nitride LayersPräsentation Presentation2007
14Langer-Hansel, Katharina ; Kogler, Sandra ; Hutter, Herbert ; Fleig, Jürgen ToF-SIMS investigations of oxygen tracer diffusion in Sr-doped LaFeO3Konferenzbeitrag Inproceedings2013
15Langer-Hansel, Katharina ; Huber, Stefanie ; Kogler, Sandra ; Hutter, Herbert ; Fleig, Jürgen ToF-SIMS investigations of oxygen tracer diffusion in Fe-doped SrTiO3 and Sr-doped LaFeO3 thin layersKonferenzbeitrag Inproceedings2014
16Larisegger, Silvia ; Holzlechner, Gerald ; Eitenberger, Elisabeth ; Rogalli, Michael ; Nelhiebel, Michael ; Schulze, Holger ; Kubicek, Markus ; Danninger, Herbert ; Hutter, Herbert ToF-SIMS Characterization of Passivation Systems for the Copper Metallization in Semiconductor DevicesKonferenzbeitrag Inproceedings2012
17Holzweber, Markus ; Hutter, Herbert ; Linert, Wolfgang ToF-SIMS Analysis of Ionic LiquidsKonferenzbeitrag Inproceedings2010
18Schnöller, Johannes ; Franz, Robert ; Mitterer, Christian ; Hutter, Herbert TOF- SIMS Analysis of oxidized vanadium - alloyed AlCrN CoatingsPräsentation Presentation2008
19Schnöller, Johannes ; Wiesinger, Rita ; Kleber, Christoph ; Hilfrich, Uwe ; Schreiner, Manfred ; Hutter, Herbert TOF - SIMS Investigations on Weathered Ag-SurfacesPräsentation Presentation2007
20Hutter, Herbert ; Schnöller, Johannes ; Schintlmeister, A ; Puchner, Stefan TOF - SIMS Analysis of Thin LayersPräsentation Presentation2007

Results 1-20 of 27 (Search time: 0.005 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Moestl Jakob Michael - 2013 - UEber die Zeitstandfestigkeit von niedriglegiertem...pdf.jpgMöstl, Jakob Michael Über die Zeitstandfestigkeit von niedriglegiertem Sphäroguss SiMo1000Thesis Hochschulschrift 2013
2Holzlechner, Gerald ToF-SIMS analysis of the defect chemistry in donor doped PZTThesis Hochschulschrift2015
3Baghbanha, Somayeh Solderability of evaporated and sputtered metallic layersThesis Hochschulschrift2015
4Haager Lena - 2020 - Oxidation - and Oxygen Diffusion - Behaviour in Hafnium...pdf.jpgHaager, Lena Oxidation - and oxygen diffusion - behaviour in hafnium based thin films analysed with a ToF-SIMSThesis Hochschulschrift 2020
5Widder Lukas - 2019 - A novel approach for characterization of industrial...pdf.jpgWidder, Lukas A novel approach for characterization of industrial lubricant additives in boundary surface tribofilms by atmospheric pressure matrix assisted laser desorption/ionizationThesis Hochschulschrift 2019
6Leitzenberger, Michael Migration mobiler Ionen in SiliziumoxidenThesis Hochschulschrift2018
7Holzer, Sabine Migration behaviour of mobile ions within chemical vapour deposited silicon oxide layersThesis Hochschulschrift2017
8Bohrn, Fabian ion migration studies in epoxy molding compoundsThesis Hochschulschrift2022
9Appenroth Julia - 2019 - Ion diffusion in polyimides from aqueous solution...pdf.jpgAppenroth, Julia Ion diffusion in polyimides : from aqueous solution, measured with ToF-SIMSThesis Hochschulschrift 2019
10Schwab, Stefan Ion diffusion and migration in semiconductor passivation and encapsulation materialsThesis Hochschulschrift2017
11Bleier, Anna Investigations on Phase Formation and Diffusion of Lead-free Solder on Semiconductor MetallizationsThesis Hochschulschrift2022
12Kügler, Peter Michael Investigation and optimization of backside metallizations for interconnects in semiconductor devicesThesis Hochschulschrift2022
13Fugger, Michael Integrity of diffusion barriers in modern high-voltage power semiconductorsThesis Hochschulschrift2014
14Fuchs, Tanja Entwicklung und Charakterisierung zuverlässiger Dickschicht-Leiterbahnstrukturen auf Aluminiumnitrid KeramiksubstratenThesis Hochschulschrift2013
15Bartel Matthias - 2007 - The effect of counterions and solvent on the properties...pdf.jpgBartel, Matthias The effect of counterions and solvent on the properties of 3D spin crossover polymersThesis Hochschulschrift 2007
16Amsüss, Andreas Diffusion and phase formation in the Al-Cu thin film system investigated with ToF-SIMS and grazing incidence X-ray diffractionThesis Hochschulschrift2019
17Ludwig Elke - 2014 - Development of ICP-based methods for quantification of...pdf.jpgLudwig, Elke Development of ICP-based methods for quantification of sulfur in electro-deposited copper samplesThesis Hochschulschrift 2014
18Schwab, Stefan Development and modification of low stress copper layers for the semiconductor industryThesis Hochschulschrift2014
19Petschnigg, Madeleine Development and characterization of PZT thin films for MEMS applicationsThesis Hochschulschrift2021
20Larisegger, Silvia Corrosion phenomena and corrosion prevention of copper electrodes in semiconductor devicesThesis Hochschulschrift2015