Illarionov, Yury
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Projektass.(FWF) Dr.techn.
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Illarionov, Yury
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 |  | Illarionov, Yury | Characterization and modeling of charged defects in silicon and 2D field-effect transistors | Thesis Hochschulschrift | 2016 |