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| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Rossi, S. ; Alomari, M. ; Zhang, Y. ; Bychikhin, S. ; Pogany, D. ; Weaver, J.M.R. ; Kohn, E. | Thermal analysis of submicron nanocrystalline diamond films | Artikel Article | 2013 |
| 2 | | Pfost, M. ; Costachescu, D. ; Mayerhofer, A. ; Stecher, M. ; Bychikhin, S. ; Pogany, D. ; Gornik, E. | Accurate Temperature Measurements of DMOS Power Transistors up to Thermal Runaway by Small Embedded Sensors | Artikel Article | 2012 |
| 3 | | Rhayem, J. ; Besbes, B. ; Blečić, R. ; Bychikhin, S. ; Haberfehlner, G. ; Pogany, D. ; Desoete, B. ; Gillon, R. ; Wieers, A. ; Tack, M. | Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices | Artikel Article | 2012 |
| 4 | | Marko, P. ; Meneghini, M. ; Bychikhin, S. ; Marcon, D. ; Meneghesso, G. ; Zanoni, E. ; Pogany, D. | IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors | Artikel Article | 2012 |
| 5 | | Mamanee, W. ; Bychikhin, S. ; Johnsson, D. ; Jensen, N. ; Stecher, M. ; Gornik, E. ; Pogany, D. | Effect of Elevated Ambient Temperature on Thermal Breakdown Behavior in BCD ESD Protection Devices Subjected to Long Electrical Overstress Pulses | Artikel Article | 2012 |
| 6 | | Pogany, D. ; Johnsson, D. ; Bychikhin, S. ; Esmark, K. ; Rodin, P. ; Stecher, M. ; Gornik, E. ; Gossner, H. | Measuring Holding Voltage Related to Homogeneous Current Flow in Wide ESD Protection Structures Using Multilevel TLP | Artikel Article | 2011 |
| 7 | | Pogany, D. ; Bychikhin, S. ; Heer, M. ; Mamanee, W. ; Gornik, E. | Application of transient interferometric mapping method for ESD and latch-up analysis | Artikel Article | 2011 |
