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Rendek, K.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Molnár, M. ; Donoval, D. ; Kuzmík, J. ; Marek, J. ; Chvála, A. ; Príbytný, P. ; Mikolášek, M. ; Rendek, K. ; Palankovski, V.	Simulation study of interface traps and bulk traps in n⁺⁺GaN/InAlN/AlN/GaN high electron mobility transistors	Artikel Article	1-Sep-2014