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Sklyar, Oleg

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		Preview	Author(s)	Title	Type	Issue Date
	1		Sklyar, Oleg ; Kueng, A. ; Kranz, C. ; Mizaikoff, Boris ; Lugstein, Alois ; Bertagnolli, Emmerich ; Wittstock, Gunther	Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy-SECM Probes Using the Boundary Element Method	Artikel Article	2005