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Hoffmann, J.
 

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1Kasper, M. ; Gramse, G. ; Hoffmann, J. ; Gaquiere, C. ; Feger, R. ; Stelzer, A. ; Smoliner, Jürgen ; Kienberger, F. Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHzArtikel Article 2014