Record link: 
http://hdl.handle.net/20.500.12708/157822
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Title: 
Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz
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Citation: 
Kasper, M., Gramse, G., Hoffmann, J., Gaquiere, C., Feger, R., Stelzer, A., Smoliner, J., & Kienberger, F. (2014). Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz. Journal of Applied Physics, 116(18), 184301. https://doi.org/10.1063/1.4897922
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Publisher DOI: 
10.1063/1.4897922
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Kasper, M. 
Gramse, G. 
Hoffmann, J. 
Gaquiere, C. 
Feger, R. 
Stelzer, A. 
Smoliner, Jürgen 
Kienberger, F. 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Journal: 
Journal of Applied Physics 
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ISSN: 
0021-8979
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Date (published): 
2014
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Number of Pages: 
8
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Publisher: 
AMER INST PHYSICS
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Peer reviewed: 
Yes
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Keywords: 
General Physics and Astronomy
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Research Areas: 
Materials Characterization: 50%
Nanoelectronics: 50%
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
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