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Zahedmanesh, Houman

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		Preview	Author(s)	Title	Type	Issue Date
	1		Saleh, Ahmed Sobhi ; Croes, Kristof ; Ceric, Hajdin ; De Wolf, Ingrid ; Zahedmanesh, Houman	A Comprehensive Microstructure-Aware Electromigration Modeling Framework; Investigation of the Impact of Trench Dimensions in Damascene Copper Interconnects	Article Artikel	16-Nov-2024
	2		Saleh, A. S. ; Croes, K. ; Ceric, Hajdin ; De Wolf, I. ; Zahedmanesh, H.	A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability	Article Artikel	7-Oct-2023